Field emission scanning electron microscope
Brand: Hitachi S4800
Type: Equipment
Type: Equipment
Scanning electron microscope with field emission gun (FEG) and a resolution of 1.4 nm to 1 kV.
Description
Scanning electron microscope with field emission gun (FEG) and a resolution of 1.4 nm to 1 kV. This equipment has two secondary electron detectors for wide-range working distances, additionally enabling deceleration and detection of backscattered electrons. Detector of transmitted electrons. RX Bruker detector with Quantax 400 programme for microanalysis. Motorised on five axes.
Practical implementation
- Morphological studies of both biological samples and materials.
- Characterisation of surfaces and roughness studies.
- Quality control.
- Material fatigue and corrosion analysis.
- Determination of elemental composition.
- Fracture analysis.
- Characterisation of semiconductors.
- Study of nanomaterials and nanoparticles.
Quality certifications
ISO 9001:2015
Terms of use
UV structures that manages it
Central Service for Experimental Research (SCSIE)
