Description
Characterisation using high-resolution X-ray diffraction (HRXRD), X-ray multiple diffraction (XRMD), scanning electron microscopy (SEM), high-resolution transmission microscopy (HRTEM). The materials analysed can be bulk, layered or nanostructures.
Keywords
SEM, XRD, HRXRD, HRTEM
Manager UV
- Martinez Tomas, M Del Carmen
- PDI-Catedratic/a d'Universitat
Frascati classification
