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 Ana Cros

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Strain in NW heterostructures 

 

 

 

 

 

   

 

You can combine two or more materials in a nanowire (NW) to form a

NW-heterostructure.

 

Most generally, both materials will have different lattice parameters. When they grow

one on top of the other, the lattice deforms. The resulting deformation will depend on the

geometry of the heterostructures. For GaN/AlN heterostructures the differences are

explained in the following figure:

 

 

Raman scattering is an optical technique that provides information about the frequency of the

vibrational modes of the material. Since the frequency of the modes change with strain,

Raman scattering results may provide information of strain in NW heterostructures.

 

 

 

In this example Raman scattering experiments

were performed on GaN/AlN nanowire

radial heterostructures. It was possible to

distinguish between heterostructures under elastic

and plastic deformation.

 

For this experiment the samples, consisting of

GaN/AlN axial NW-heterostructures grown on silicon

By MBE at CEA (Grenoble) were illuminated with

a 515 nm line Ar+ laser. A 100x microscope objective

was used to focus the light on the sample and collect

the scattered light to the spectrometer.

 

 

 

 

In the case of core-shell NW heterostructures, stran is only important along the NW axis. Under these

conditions Raman scattering provides numerical information of strain in the samples.

 

Here left we can see the evolution of the E2h phonon

Mode of GaN as the AlN shell thickness increases. The

mode indicates that tensile strain increases in the NWs

until a shell thickness of 3 nm. After that strain is

partially relaxed. Transmission Electron Micrographs

showed that this relaxation correlates with nanowires

that are bent due to the anisotropic deposition of the

AlN shell around the GaN core.

 

K. Hestroffer et al., Nanotechnology 21,415702 (2010).