Description
Characterisation of graphene on metal, number of layers, defects and doping, by Raman scattering and SPM techniques (AFM, CAFM, KPFM).
Type
Service
Fields of application
- Archaeology. History. History of Art.
- Characterisation of surfaces.
- Photovoltaic devices.
- Industries in the electronics, energy, aerospace, automotive, ceramics, metal-mechanical and chemical sectors.
- Lighting.
- Electrical nano-characterisation, sensors, catalysts, optical devices, drug delivery systems.
- Restoration and conservation of cultural heritage.
- Chemical and biochemical sensors.
Resources
- Surface and porosity analysis laboratory
- Materials preparation laboratory
- Detector CCD Spectrum One
- Detector CCD Jobin-Yvon
- Laser laboratory
- Spectrometer Acton Spectra Pro-2556
- Spectrometer TRIAX190
- Atomic force microscope NANOTEC S.L.
- Ion-Argon laser model INNOVA 301C
- High-resolution Raman microscopy
- Atomic force microscopy
- Synthesis laboratory
- Particle laboratory
- Formulaction Turbiscan Lab
- Malvern Zetasizer ZS
- Malvern Mastersizer 2000
- HORIBA Jobin Yvon iHR320 RAMAN spectrometer with Peltier-cooled CCD and three 532 nm doubled YAG, 781nm and 464nm lasers
- Portable EDXRF spectrometer
CNAE
Contact
Burjassot/Paterna Campus
Science ParkC/ Catedrático José Beltrán, 2
46980 Paterna (Valencia)
