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Description

Static, dynamic and thermal characterisation of passive and active power devices (Si, SiC, GaN).

Keywords

static characterisation of semiconductor devices, dynamic characterisation of semiconductor devices

Research group
Laboratory of Industrial Electronics and Instrumentation (LEII)

https://www.uv.es/laboratory-industrial-electronics-leii/en/laboratory-industrial-electronics-instrumentation-leii.html

leii@uv.es

Frascati classification