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High resolution ion scanning microscope ORION NanoFab HIM Zeiss

Orion
High resolution ion scanning microscope ORION NanoFab HIM Zeiss
Brand: ZEISS ORION NanoFab
Type: Equipment

The ORION NanoFab is an ion microscope designed for the fabrication of nanostructures less than 10 nm using a helium beam. The neon beam allows for an increased the rate of nanostructure formation, thus improving efficiency and performance. The ORION is also capable of acquiring images with a resolution of up to 0.5 nm.

Description

The ORION NanoFab is a He and Ne ion microscope specifically designed for the nanofabrication of structures. It incorporates an Everhart Thornley secondary electron detector and charge compensation via a flow of electrons. Below are the specifications of the equipment:

GFIS Column: 800 µm – 100 nm field of view at an 8 mm WD

Helium ion beam:

  • 0.5 nm resolution at 30 kV
  • Energy of the beam 10 – 30 kV
  • Beam current from 0.1 to 100 pA

Neon ion beam:

  • 1.9 nm resolution at 25 kV
  • Energy of the beam 10 – 25 kV
  • Beam current from 0.1 to 50 pA

Image acquisition system:

  • Image size up to 2000×2000 pixels
  • Dwell time 100 ns to 100 ms

Sample: Maximum size of 50 mm x 50 mm x 6 mm

Practical implementation
  • nanofabrication
  • materials science
  • high-resolution image
Quality certifications

ISO 9001:2015