- Structural characterisation
Characterisation using high-resolution X-ray diffraction (HRXRD), X-ray multiple diffraction (XRMD), scanning electron microscopy (SEM), high-resolution transmission microscopy (HRTEM). The materials analysed can be bulk, layered or nanostructures.
- Crystalline growth
Growth of materials using the techniques of: Bridgman, hot zone transport (THM), vapour phase deposition (PVD), organometallic chemical phase deposition (MOCVD), spray pyrolysis (SP). Currently, different types of oxides (CdO, MgO, ZnO) are being grown.
- Physical properties
Characterisation of physical properties, with special emphasis on optical properties: absorption, photoluminescence, Raman spectroscopy.