Type: Equipment
Description
AFM NANOTEC S.L. with double dynamic card for Kelvin Probe Force Microscopy current amplifier and electrometer designed for picoampere measurements and coupled optical microscope.
UV structures that manages it
AFM NANOTEC S.L. with double dynamic card for Kelvin Probe Force Microscopy current amplifier and electrometer designed for picoampere measurements and coupled optical microscope.