Type: Equipment
X-ray diffraction system multi-purpose diffractometer and Pre-FIX system has the unique ability to measure, with a single instrument, any type of sample: from powders to thin films and from nanomaterials to solid objects.
Diffractometer for analysis of samples in the form of thin films, analysis of residual stresses and textures.
The equipment is configured with a high resolution horizontal goniometer, a Cu X-ray tube and an Eulerian cradle as a sample holder platform that allows programmable Phi, Psi, X, Y, Z movements.
The incident beam optics modules available are:
- Fixed divergence slit.
- Four-crystal Ge (220) monochromator.
- X-ray mirror.
- Crossed slit point focus collimator.
The diffracted beam optics available are:
- Fixed anti-scatter and receiving slits.
- Secondary curved monochromator.
- Parallel beam collimator.
- Sealed proportional Xe detector.
Qualitative and quantitative analysis of crystalline phases and polymorphism.
High resolution X-ray diffraction analysis which allow:
- The study of preferential orientations and texture analysis.
- Depth-dependent studies by grazing incidence.
- Characterisation of epitaxial layers.
ISO 9001:2015
Restricted to SCSIE X-ray Diffraction Section staff only. Contact the Section.
- Mestre Segarra, Alicia Maria
- PAS-E.T.S. Investigacio
