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SAXS (Small Angle X-ray Scattering) X-ray diffraction system

SAXS N8 HORIZON
SAXS (Small Angle X-ray Scattering) X-ray diffraction system
Brand: Bruker AXS, model N8 HORIZON
Type: Equipment

Bruker N8 HORIZON X-ray diffraction system is a compact, specific and dedicated laboratory equipment for the analysis of Small Angle X-ray Scattering (SAXS) and Grazing Incidence Small Angle X-ray Scattering (GISAXS).

Small angle X-ray diffraction analysis allows to obtain values of particle size and distribution, distance between particles, as well as their arrangement. Establishing volume fractions and degree of crystallinity in materials, calculating porosity, shape and dimensions of nanoparticles.

Description

The Small Angle X-ray Scattering SAXS equipment is a vertical diffraction system consisting of a microfocus (IuS) point X-ray source with a maximum power of 50W, air-cooled.

The primary and secondary beam paths are in vacuum with two pinhole positions, with SCATEX pinhole and Beam Stop collimators for extended resolution. The Montel optics are integrated in the X-ray source with a spot size of 0.8x0.8mm and a divergence of less than 0.1°.

Vantec 500 2D detector with high resolution and low background noise with a 360° field of view.

The large sample chamber includes a motorised XY platform, which can be used as a sample changer or scanning device for Nanography. Additionally, this platform allows precise alignment of the sample in the X-ray beam.

Practical implementation
  • Shape and size analysis of nanoparticles in solid state and in solution by High Resolution SAXS technique in the range of 1-100 nm.
  • Pore size determination and specific internal surface area analysis in meso- and micro-porous systems.
  • Determination of orientation and internal structure in "fibre" type samples.
  • Monitoring of reactions in supramolecular interacting systems by "time-resolved" SAXS.
  • Advanced analysis of the structures of thin solid layers on surfaces by grazing-incidence small angle X-ray scattering GISAXS.
  • Structure analysis in "position-resolved" with µm resolution (X-Ray Nanography).
Quality certifications

ISO 9001:2015

Terms of use

Restricted to SCSIE X-ray Diffraction Section staff only. Contact the Section.