Type: Equipment
Bruker D8 ADVANCE A25 X-ray diffraction system capable of measuring crystalline phases on powder samples, thin films and small heterogeneous solid samples.
The X-ray diffraction equipment is configured for the analysis of polycrystalline samples. It has an X-ray tube with linear focus Cu radiation, a theta-theta configuration goniometer with a range of 1-130º.
The unit is equipped with a twin-twin system with binary primary and secondary optics, which allows measurements with divergent beam-parallel beam. Motorised programmable slits and Göbel mirror. The unit is also equipped with a sample holder with automatic changer for at least 45 samples.
The LYNXEYE fast detector can work in both linear (3º θ) and spot mode.
The system incorporates a temperature controller for an accessory temperature chamber (Anton Paar) which allows X-ray diffraction analysis to be carried out simultaneously with temperature variation, from room temperature up to 1200ºC.
Qualitative and quantitative identification of the different crystalline phases present in the samples, as well as structural studies.
Qualitative and quantitative analysis of crystalline phases by X-ray diffraction of polycrystalline materials.
ISO 9001:2015
Restricted to SCSIE X-ray Diffraction Section staff only. Contact the Section.
- Mestre Segarra, Alicia Maria
- PAS-Ets Investigacio
