This is a very practical and useful seminar for those who want to refresh the most important concepts in some of the most common challenges in EMC, while discovering a number of tools with great potential to analyse and optimize a particular design.
Burjassot, Valencia (24 October)
Escola Tècnica Superior d’Enginyería - Universitat de València
Avida. de la Universitat, s/n
Aula 2.1.5
In this seminar will be presented the fundamentals of design and solving of common problems of electromagnetic compatibility using scanners and measurement tools in near field.
The seminar will be given by Arturo Mediano, Doctorate in Industrial Engineering and Tenured Professor at the University of Zaragoza. He is also member of the Group of Power Electronics and Microelectronics (GEPM) of the Aragón Institute of Engineering Research of the University of Zaragoza..
The agenda of the seminar will be as follows:
|
Schedule |
Presentation |
|
08:30 – 09:00 |
Registration |
|
09:00 – 09:15 |
Welcome and Presentation |
|
09:15 – 10:45 |
Review of the foundations EMI/EMC · EMI/EMC: sources and victims · Two problems: emission and inmunity · Electric and magnetic fields in electronic circuits · ¿Why do we have EMI/EMC problems? · The great secret: to control the current · Discovering NEAR and FAR fields |
|
10:45 – 11:30 |
Design and diagnostic tools · Near-field probes and accessories · Near-field scanners · Spatial and spectral scanner |
|
11:30 – 12:00 |
Break |
|
12:00 – 13:00 |
Real cases and demonstrations · Scanner in various real designs · FieldFox and EMSCAN demonstrations · Example: ferrites, cable, decoupling and filtering |
|
13:00 – 14:00 |
Presentation of the used solutions of measurement and questions |
